DocumentCode
2146438
Title
Efficient electroluminescence from rare-earth implanted SiO2 metal-oxide-semiconductor structures
Author
Sun, J.M. ; Skorupa, W. ; Dekorsy, T. ; Helm, M. ; Rebohle, L. ; Gebel, T.
Author_Institution
Inst. of Ion Beam Phys. & Mater. Res., Forschungszentrum Rossendorf, Dresden, Germany
fYear
2005
fDate
21-23 Sept. 2005
Firstpage
48
Lastpage
50
Abstract
The IR, green, and UV electroluminescence from rare-earth (Er, Tb, and Gd) implanted SiO2 MOS devices is studied, exhibiting quantum efficiencies comparable to III-V light emitting diodes.
Keywords
MIS devices; electroluminescence; ion implantation; light emitting devices; silicon compounds; IR electroluminescence; MOS devices; SiO2:Er; SiO2:Gd; SiO2:Tb; UV electroluminescence; green electroluminescence; metal-oxide-semiconductor structures; quantum efficiencies; rare-earth implanted SiO2; Annealing; Electrodes; Electroluminescence; Electroluminescent devices; Erbium; III-V semiconductor materials; Ion beams; Light emitting diodes; Silicon; Sun;
fLanguage
English
Publisher
ieee
Conference_Titel
Group IV Photonics, 2005. 2nd IEEE International Conference on
Print_ISBN
0-7803-9070-9
Type
conf
DOI
10.1109/GROUP4.2005.1516399
Filename
1516399
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