Title :
Full pattern comparsion of PO and MER line integrations with SGO correction
Author :
Lu, Pengfei ; Ando, Makoto
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
This paper investigates the accuracy of equivalent edge currents by Modified Edge Representation (MER-EEC) in surface-to-line integral reduction of Physical Optics (PO) integration. The enhanced accuracy by introducing the closed form correction term for the inner stationary phase point was confirmed.
Keywords :
electromagnetic wave diffraction; electromagnetic wave scattering; geometrical optics; MER line integration; MER-EEC; PO integration; SGO correction; diffraction analysis; full pattern comparsion; inner stationary phase point; modified edge representation; physical optics; scattering; scattering geometrical optics; surface-to-line integral reduction; Accuracy; Approximation methods; Observers; Optical surface waves; Physical optics; Scattering; Surface waves;
Conference_Titel :
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4673-0461-0
DOI :
10.1109/APS.2012.6348781
