DocumentCode
2147060
Title
Electrooptic mapping of a MESFET interdigitated structure
Author
Rodriguez-Llorente, F. ; Dudley, R.A. ; Roddie, A.G.
Author_Institution
Centre for Electromagnetic and Time Metrology. National Physical Laboratory., Teddington, Middlesex, TW11 0LW, United Kingdom. Telph: +44 (0)20 8943 6672, Fax: +44 (0)20 8943 6890, email: fr@npl.co.uk
Volume
2
fYear
1999
fDate
Oct. 1999
Firstpage
69
Lastpage
71
Abstract
The electric field above a MESFET has been measured using electrooptic sampling. The measurements show the electric field distribution above the interdigitated structure to be asymmetric, suggesting an unbalanced distribution of the amplification between the fingers. This result is just one example of how electrooptic sampling can detect problems inside a device not detectable using traditional vector network analyser techniques.
Keywords
Earth Observing System; Electric variables measurement; Fingers; Integrated circuit measurements; Lasers and electrooptics; MESFETs; MMICs; Masers; Probes; Sampling methods;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1999. 29th European
Conference_Location
Munich, Germany
Type
conf
DOI
10.1109/EUMA.1999.338411
Filename
4139440
Link To Document