DocumentCode :
2147064
Title :
Er3+ absorption cross section in Si-nanocrystal waveguides in SiO2
Author :
Melchiorri, M. ; Daldosso, N. ; Navarre, D. ; Pavesi, L. ; Gourbilleau, F. ; Carrada, M. ; Rizk, R.
Author_Institution :
Dipartimento di Fisica, Trento Univ., Povo, Italy
fYear :
2005
fDate :
21-23 Sept. 2005
Firstpage :
120
Lastpage :
122
Abstract :
This paper reports on Er3+ absorption cross section measurement by transmission measurements in waveguide σabs measured value is 0.5-1.7 × cm at 1534 nm for all samples resulting very close to that of Er3+ in pure silica.
Keywords :
elemental semiconductors; erbium; nanostructured materials; optical waveguides; silicon; Er3+ absorption cross section; Si-nanocrystal waveguides; Si:Er3+; pure silica; transmission measurements; Absorption; Erbium; Face detection; Insertion loss; Light scattering; Loss measurement; Optical films; Optical scattering; Rayleigh scattering; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Group IV Photonics, 2005. 2nd IEEE International Conference on
Print_ISBN :
0-7803-9070-9
Type :
conf
DOI :
10.1109/GROUP4.2005.1516424
Filename :
1516424
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2147064
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