DocumentCode :
2147110
Title :
Selective nickel and gold plating for enhanced wire bonding technology
Author :
Cheng, Tien ; Petrarca, Kevin ; Srivastava, Kamalesh ; Knickerbocker, Sarah ; Volant, Richard ; Sauter, Wolfgang ; McKnight, Samuel ; Allard, Stephanie ; Beaulieu, Frederic ; Restaino, Darryl ; Hisada, Takashi
Author_Institution :
IBM Microelectron. Div., IBM Syst. & Technol. Group, Hopewell Junction, NY
fYear :
0
fDate :
0-0 0
Abstract :
Nickel and gold are electrodeposited on wire bond pads by a newly developed selective plating process in which plating is done without photoresist. The gold terminal metal offers exciting advantage over the traditional aluminum metallurgy. The unique self-encapsulating structure of gold and nickel over copper seed is illustrated. The plating tool, process control and thickness uniformity are described. We have evaluated this structure with probing, aging and stress under high temperature (200degC) in conjunction with bonding. We also varied the bonding conditions to allow a wider choice of inter-level dielectrics and structure/device placement under pads. All the data shows that this is a viable alternative to the current process of record
Keywords :
electroplating; encapsulation; gold alloys; lead bonding; nickel alloys; process control; Au; Ni; bonding conditions; electrodeposition; enhanced wirebonding; gold plating; inter-level dielectrics; nickel plating; process control; selective plating process; self-encapsulating structure; thickness uniformity; wirebond pads; Aging; Aluminum; Bonding; Copper; Gold; Nickel; Process control; Resists; Stress; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2006. Proceedings. 56th
Conference_Location :
San Diego, CA
ISSN :
0569-5503
Print_ISBN :
1-4244-0152-6
Type :
conf
DOI :
10.1109/ECTC.2006.1645922
Filename :
1645922
Link To Document :
بازگشت