DocumentCode :
2147141
Title :
Surfactant-mediated molecular-beam epitaxy of highly-strained III-V semiconductor heterostructures
Author :
Tournié, E. ; Ploog, K.H. ; Grandjean, N. ; Massies, J.
Author_Institution :
Paul-Drude-Inst. fur Festkorperelektronik, Berlin, Germany
fYear :
1994
fDate :
27-31 Mar 1994
Firstpage :
49
Lastpage :
52
Abstract :
The epitaxial growth of strained-layer heterostructures (SLHs) is currently under intense investigation, driven by the desire to obtain new physical properties different from those of the individual constituents of the structure. Much work is directed toward controlling the epitaxial morphology, i.e. the growth mode, of strained layers because this eventually governs the properties of SLHs. Surfactant-mediated molecular-beam epitaxy (SM-MBE) is a technique recently developed to face this challenge. We summarize the main results achieved with this approach in the field of III-V SLHs
Keywords :
III-V semiconductors; molecular beam epitaxial growth; semiconductor growth; semiconductor quantum wells; III-V SLHs; III-V semiconductor heterostructures; epitaxial growth; epitaxial morphology; growth mode; highly-strained; physical properties; semiconductor growth; strained layers; strained-layer heterostructures; surfactant-mediated molecular-beam epitaxy; Capacitive sensors; Delay; Gallium arsenide; III-V semiconductor materials; Lattices; Molecular beam epitaxial growth; Semiconductor films; Substrates; Tellurium; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1994. Conference Proceedings., Sixth International Conference on
Conference_Location :
Santa Barbara, CA
Print_ISBN :
0-7803-1476-X
Type :
conf
DOI :
10.1109/ICIPRM.1994.328157
Filename :
328157
Link To Document :
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