DocumentCode :
2147190
Title :
Analysis of insulator surface charging due to charge injection and secondary electron emission in vacuum
Author :
Zhang, Guan-Jun ; Wen-Bin Zhao ; Yan, Zhang
Author_Institution :
Sch. of Electr. Eng., Xi´´an Jiaotong Univ., China
fYear :
2002
fDate :
2002
Firstpage :
622
Lastpage :
625
Abstract :
During the developing process of flashover across an insulator in vacuum, the insulator surface is usually charged. It is of great importance to analyze the charging phenomena for better understanding the flashover characteristics in vacuum. It is considered that there are two kinds of mechanisms closely related to the surface charging phenomena of insulating materials, i.e., the classical secondary electron emission occurring over an insulator, and charge injection and accumulation occurring inside an insulator. Based on the rigorous analysis of the kinetic processes of both primary and secondary electrons, the related surface charges were analyzed. In this process, the influence of image force of mirror charge was taken into account. Involving the detrapping of charges trapped and the recombination of charges injected, the charging process due to charge injection and accumulation was also deduced theoretically. Some formulas were given to express the density of surface charges.
Keywords :
flashover; insulators; secondary electron emission; surface charging; surface discharges; vacuum breakdown; charge accumulation; charge injection; charges detrapping; flashover characteristics; image force; insulator surface charging; kinetic processes; mirror charge; primary electrons; secondary electron emission; secondary electrons; surface charges density; vacuum; Acceleration; Cathodes; Dielectrics and electrical insulation; Electrodes; Electron emission; Flashover; Kinetic theory; Mirrors; Surface charging; Surface discharges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum, 2002. 20th International Symposium on
Print_ISBN :
0-7803-7394-4
Type :
conf
DOI :
10.1109/ISDEIV.2002.1027451
Filename :
1027451
Link To Document :
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