DocumentCode :
2147419
Title :
Fabrication and characteristics of ZnO-based thin film transistors
Author :
Han, Dedong ; Wang, Yi ; Zhang, Shengdong ; Sun, Lei ; Kang, Jinfeng ; Liu, Xiaoyan ; Du, Gang ; Liu, Lifeng ; Han, Ruqi
Author_Institution :
Key Lab. of Microelectron. Devices & Circuits, Peking Univ., Beijing, China
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
982
Lastpage :
984
Abstract :
ZnO-based thin-film transistors (TFT) have been fabricated on p-Si (100) substrates by radio frequency (rf) magnetron sputtering at room temperature with a bottom gate configuration. The XRD and SEM show that ZnO films had high crystalline quality. The ZnO films present an average optical transmission (including the glass substrate) of 80% in the visible part of the spectrum. The electrical properties of ZnO-based TFTs were investigated by ID-VD and ID-VG measurements. The ZnO TFT operates in the enhancement mode with a channel mobility of 6.86 cm2/V · s. The combination of transparency, high channel mobility and room temperature processing makes the ZnO-TFT a very promising low cost optoelectronic device for the next generation of flat panel display (FDP).
Keywords :
II-VI semiconductors; X-ray diffraction; characteristics measurement; flat panel displays; optoelectronic devices; scanning electron microscopy; semiconductor device measurement; semiconductor thin films; silicon; sputtered coatings; thin film transistors; wide band gap semiconductors; zinc compounds; FDP; ID-VD measurement; ID-VG measurement; SEM; Si; TFT; XRD; ZnO; bottom gate configuration; channel mobility; flat panel display; optical transmission; optoelectronic device; radio frequency magnetron sputtering; temperature 293 K to 298 K; thin film transistor fabrication; Crystallization; Fabrication; Optical films; Radio frequency; Sputtering; Substrates; Temperature; Thin film transistors; X-ray scattering; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4734708
Filename :
4734708
Link To Document :
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