DocumentCode
2147428
Title
Thermal evaluation of standard and power TQFP
Author
Zhou, T. ; Hundt, M. ; Motta, V.
Author_Institution
Corp. Package Dev., SGS-Thomson Microelectron. Inc., Carrollton, TX, USA
fYear
1996
fDate
5-7 Mar 1996
Firstpage
19
Lastpage
29
Abstract
In this paper, thermal performance of Standard and power TQFP packages is investigated. CFD simulation is performed to study the effects of board and package construction, and power package copper slug direct attach to the board. Thermal paths are analyzed by viewing the heat dissipation percentage through package surfaces. The following conclusions can be made from this study: (1) For most plastic packages at a given power dissipation and cooling condition, the temperature drop from junction to board is only dependent on package construction. The temperature drop from board to ambient is a function of board construction. Junction to ambient thermal resistance can be obtained by superimposing the two parts. (2) In general, the dominant thermal path for plastic packages is conduction through leads to PCB. (3) The thermal resistance for the Power TQFP is 13°C/W lower than that of the standard TQFP. (4) Power TQFP slug direct attach to the board reduces the thermal resistance by 45%. (5) Copper pad and thermal vias under the package will reduce the thermal resistance up to 2.7°C/W (7%) for the Power TQFP. Using smaller package stand off results in 5°C/W (13%) thermal resistance reduction
Keywords
plastic packaging; thermal resistance; CFD simulation; Cu; copper pad; copper slug direct attach; heat dissipation; lead conduction; plastic package; power TQFP; standard TQFP; temperature drop; thermal resistance; thermal via; Computational fluid dynamics; Copper; Electrical resistance measurement; Microelectronics; Plastic packaging; Temperature sensors; Thermal conductivity; Thermal factors; Thermal management; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1996. SEMI-THERM XII. Proceedings., Twelfth Annual IEEE
Conference_Location
Austin, TX
ISSN
1065-2221
Print_ISBN
0-7803-3139-7
Type
conf
DOI
10.1109/STHERM.1996.545087
Filename
545087
Link To Document