Title : 
Temperature dependence of photoluminescence properties of CdSxSe1−x quantum dots prepared on silicon substrate
         
        
            Author : 
Chen, X. ; Zhang, H.Q. ; Hu, L.Z. ; Yu, D.Q. ; Zhao, Z.W. ; Qiao, S.S. ; Li, J. ; Zhu, J.X.
         
        
            Author_Institution : 
Sch. of Phys. & Optoelectron. Technol., Dalian Univ. of Technol., Dalian, China
         
        
        
        
        
        
            Abstract : 
CdSxSe1-x quantum dots (QDs) were prepared on silicon substrate by a simple physical method. The temperature dependent photoluminescence (PL) properties of the CdSxSe1-x QDs have been investigated in a temperature range of 10-300 K. The PL intensity reveals an unusual increasing behaviour with increasing temperature in the range of 180 - 260 K. And the energy gap shows a redshift of 62.23 meV when the temperature increases from 10 K to 300 K. The sulfur component (x) of CdSxSe1-x QDs is about 86.45% by calculation approximatively from PL peak energy at room temperature following Vigo¿s Law. We also obtain the parameters of the varshni relation for CdSxSe1-x QDs from PL peak energy as a function of temperature and the best-fit curve.
         
        
            Keywords : 
II-VI semiconductors; cadmium alloys; photoluminescence; semiconductor quantum dots; wide band gap semiconductors; CdSSe; photoluminescence properties; quantum dots; temperature dependence; Energy measurement; Land surface temperature; Photoluminescence; Quantum dot lasers; Quantum dots; Semiconductor lasers; Silicon; Temperature dependence; Temperature distribution; Temperature measurement;
         
        
        
        
            Conference_Titel : 
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
         
        
            Conference_Location : 
Beijing
         
        
            Print_ISBN : 
978-1-4244-2185-5
         
        
            Electronic_ISBN : 
978-1-4244-2186-2
         
        
        
            DOI : 
10.1109/ICSICT.2008.4734715