DocumentCode :
2147834
Title :
Qualification and testing process to implement anti-counterfeiting technologies into IC packages
Author :
Kae-Nune, Nathalie ; Pesseguier, Stephanie
Author_Institution :
STMicroelectronics, Corporate Security Department, Switzerland
fYear :
2013
fDate :
18-22 March 2013
Firstpage :
1131
Lastpage :
1136
Abstract :
Counterfeiting is no longer limited to just fashion or luxury goods, the phenomenon has now reached electronics components which failure represents a high risk to the safety and security of human communities. One way for the semiconductor (SC) industry to fight against counterfeiting of electronic parts is to add technological innovation at the component level itself. The target is to enable the product authentication in a fast and reliable way. Because semiconductor manufacturing is a complex and delicate operation producing highly complex products which are sensitive to many environmental factors, any introduction of changes in its production - which the implementation of anti-counterfeiting (A/C) technologies must also comply to - must undergo thorough testing and qualification steps. This is mandatory to control the compliancy to the strict delivery requirements, quality and reliability level the industry has established, in line with the product performance specifications. This paper aims to explain the comprehensive requirements specification developed by members of semiconductor and related industries in Europe, to add authentication technologies solutions into IC packages. It also describes the qualification processes and testing plans to implement the most adequate and effective anti-counterfeiting technology (A/T). One of the main challenges in this A/C task is to make sure that the added A/C feature in electronic components does not create any additional reliability or failure issue, nor introduce additional risks that will benefit counterfeiters.
Keywords :
Authentication; Counterfeiting; Industries; Packaging; Production; Reliability; Testing; Anti-counterfeiting technologies; authentication; component counterfeiting; failure analysis; failure prevention; re-packaging; reliability testing; remarking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
ISSN :
1530-1591
Print_ISBN :
978-1-4673-5071-6
Type :
conf
DOI :
10.7873/DATE.2013.237
Filename :
6513683
Link To Document :
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