Comparative study of interference elimination in heavy metals control by Anodic Stripping Voltammetry (ASV) method

Author

Sosnin, E.A. ; Batalova, V.N. ; Buyanova, E.Yu. ; Tarasenko, V.F.

Author_Institution

High Current Electron. Inst., Acad. of Sci., Tomsk, Russia

Volume

1

fYear

2003

fDate

20-22 Aug. 2003

Firstpage

349

Abstract

The conditions for elimination of interference of surface-active organic substances (for e.g., natrium laurilsulfate) or humic acid on anodic peaks of Zn, Cd, Pb and Cu were investigated. Interference of these substances is related to their adsorption on working electrode and formation of strong ion-metal complexes. Both of them are obstacles to reduction of metal ions on the working electrode. Aiming at interfering substances destruction in solutions, the effect of ozone and UV irradiation from mercury quartz lamp (λ∼254 nm) and KrCl-excilamp (λ∼222 nm) was studied. It is presented that KrCl-excilamp is mostly efficient for surface-active organic substances destruction. Effect of Hg-lamp under TiO₂ additions in solution is less efficient. And ozone treatment of the sample is not in the least efficient here, except for Cu. All three ways can bo used for Metal+humic acid complexes destruction.

Keywords

electrochemical electrodes; interference suppression; krypton compounds; metals; ozone; titanium compounds; ultraviolet radiation effects; voltammetry (chemical analysis); 222 nm; 254 nm; Cd; Cu; KrCl excilamp; Pb; TiO₂; TiO₂ addition; UV irradiation; Zn; anodic peaks; anodic stripping voltammetry method; electrodes; heavy metals control; humic acid; interference elimination; interfering substances; mercury quartz lamp; metal ions; ozone effect; strong ion-metal complexes; surface active organic substances; ultraviolet; Chemical analysis; Electrodes; Interference elimination; Lamps; Oxidation; Signal analysis; Silver; Surface treatment; Thermal degradation; Zinc;

fLanguage

English

Publisher

ieee

Conference_Titel

Physics and Control, 2003. Proceedings. 2003 International Conference

Print_ISBN

0-7803-7939-X

Type

conf

DOI

10.1109/PHYCON.2003.1236846

Filename

1236846