DocumentCode
2147910
Title
Instability for organic field effect transistors caused by dipole on insulator surface
Author
Suemori, Kouji ; Taniguchi, Misuzu ; Kamata, Toshihide
Author_Institution
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
fYear
2008
fDate
20-23 Oct. 2008
Firstpage
1029
Lastpage
1032
Abstract
The influence of the dipole of an insulator surface on temporal changes in the source-drain current was investigated by using organic field-effect transistors with a surface-modified SiO2 insulator. The source-drain current decreased drastically with respect to time when the dipoles of the insulator surface displaced slightly. In order to obtain highly stable organic transistors, it is thus necessary to remove the mobile dipoles from the insulator surface.
Keywords
field effect transistors; silicon compounds; SiO2; insulator surface; organic field effect transistors; source-drain current; Chemicals; Coatings; Dielectrics and electrical insulation; Fabrication; Gold; OFETs; Pentacene; Plastic insulation; Polymer films; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location
Beijing
Print_ISBN
978-1-4244-2185-5
Electronic_ISBN
978-1-4244-2186-2
Type
conf
DOI
10.1109/ICSICT.2008.4734728
Filename
4734728
Link To Document