DocumentCode
2148121
Title
1996 cumulative bibliography of articles on semiconductor thermal measurement, management and modeling
Author
Siegal, Bernard S.
Author_Institution
OAI, Milpitas, CA, USA
fYear
1996
fDate
5-7 Mar 1996
Firstpage
214
Lastpage
215
Abstract
The bibliography is provided for the convenience of SEMI-THERM Symposia attendees. All the articles listed provide information on semiconductor thermal characteristics, measurement techniques and results, management techniques, hardware applications, modeling and computational techniques, and other pertinent information
Keywords
bibliographies; semiconductor device models; thermal variables measurement; bibliography; semiconductors; thermal management; thermal measurement; thermal modeling; Acoustic testing; Bibliographies; Computational modeling; Electronic packaging thermal management; Microassembly; Microscopy; Plastics; Semiconductor device manufacture; Temperature measurement; Thermal management;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Thermal Measurement and Management Symposium, 1996. SEMI-THERM XII. Proceedings., Twelfth Annual IEEE
Conference_Location
Austin, TX
ISSN
1065-2221
Print_ISBN
0-7803-3139-7
Type
conf
DOI
10.1109/STHERM.1996.545111
Filename
545111
Link To Document