Title :
1996 cumulative bibliography of articles on semiconductor thermal measurement, management and modeling
Author :
Siegal, Bernard S.
Author_Institution :
OAI, Milpitas, CA, USA
Abstract :
The bibliography is provided for the convenience of SEMI-THERM Symposia attendees. All the articles listed provide information on semiconductor thermal characteristics, measurement techniques and results, management techniques, hardware applications, modeling and computational techniques, and other pertinent information
Keywords :
bibliographies; semiconductor device models; thermal variables measurement; bibliography; semiconductors; thermal management; thermal measurement; thermal modeling; Acoustic testing; Bibliographies; Computational modeling; Electronic packaging thermal management; Microassembly; Microscopy; Plastics; Semiconductor device manufacture; Temperature measurement; Thermal management;
Conference_Titel :
Semiconductor Thermal Measurement and Management Symposium, 1996. SEMI-THERM XII. Proceedings., Twelfth Annual IEEE
Conference_Location :
Austin, TX
Print_ISBN :
0-7803-3139-7
DOI :
10.1109/STHERM.1996.545111
