DocumentCode
2148404
Title
Impact of antenna pattern and handset rotation on macro-cell and pico-cell propagation in heterogeneous LTE networks
Author
Mellios, Evangelos ; Mansor, Zuhanis ; Hilton, Geoffrey S. ; Nix, Andrew R. ; McGeehan, Joseph P.
Author_Institution
Centre for Commun. Res., Univ. of Bristol, Bristol, UK
fYear
2012
fDate
8-14 July 2012
Firstpage
1
Lastpage
2
Abstract
This paper studies the impact of antenna pattern and user handset random orientation on macro-cell and pico-cell propagation in heterogeneous LTE networks. The analysis combines measured 3D radiation patterns of basestations and handset antennas with state-of-the-art 3D ray-tracing for a large number of macro-cell and pico-cell basestations and user locations/orientations in an urban environment. Macro and pico propagation characteristics are presented as cumulative distribution functions of the received signal strength, the K-factor, the RMS delay spread and the RMS angle-of-departure and angle-of-arrival azimuth and elevation spreads. It is shown that using measured antenna patterns and considering the random user handset orientation has significant impact on the propagation characteristics of a heterogeneous LTE network.
Keywords
Long Term Evolution; antenna radiation patterns; cellular radio; delays; mobile antennas; mobile handsets; radiowave propagation; ray tracing; 3D antenna radiation pattern measurement; K- factor; RMS angle-of-departure; RMS delay spread; angle-of-arrival azimuth; antenna pattern impact; cumulative distribution function; elevation spread; handset antenna; handset random orientation; heterogeneous LTE network; macrocell base station; macrocell propagation characteristics; picocell base station; picocell propagation characteristics; received signal strength; state-of-the-art 3D ray-tracing; urban environment; user location-orientation; Antenna measurements; Antenna radiation patterns; Azimuth; Delay; Telephone sets;
fLanguage
English
Publisher
ieee
Conference_Titel
Antennas and Propagation Society International Symposium (APSURSI), 2012 IEEE
Conference_Location
Chicago, IL
ISSN
1522-3965
Print_ISBN
978-1-4673-0461-0
Type
conf
DOI
10.1109/APS.2012.6348849
Filename
6348849
Link To Document