Title :
ACE: A robust variability and aging sensor for high-k/metal gate SoC
Author :
Min Chen ; Reddy, Veerababu ; Krishnan, Sridhar ; Ondrusek, Jay ; Yu Cao
Author_Institution :
Texas Instrum. Dallas, Dallas, TX, USA
Abstract :
A novel on-chip variability and aging sensor has been designed for robust generation of a voltage guard band in high-K/metal gate technologies. It is the first single sensor solution that is capable of guard-banding for both NBTI and PBTI effects. It offers the SoC the capability to dynamically adjust the on-chip guard-band for joint power-reliability optimization.
Keywords :
ageing; circuit optimisation; high-k dielectric thin films; integrated circuit reliability; low-power electronics; negative bias temperature instability; system-on-chip; ACE; NBTI effect; PBTI effect; aging compensation echo; aging sensor; high-K/ metal gate SoC; negative bias temperature instability; positive bias temperature instability; power-reliability optimization; system-on-chip; variability sensor; voltage guard band; Aging; Degradation; Logic gates; Robustness; Sensitivity; Stress; System-on-chip;
Conference_Titel :
Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European
Conference_Location :
Bucharest
DOI :
10.1109/ESSDERC.2013.6818849
