DocumentCode
2148813
Title
Compendium of Radiation-Induced Effects for Candidate Particle Accelerator Electronics
Author
Spiezia, G. ; Brugger, M. ; Danzeca, S. ; Alia, R. Garcia ; Gaillard, R. ; Fadakis, E. ; Foucard, G. ; Losito, R. ; Masi, A. ; Mekki, J. ; Oser, P. ; Peronnard, P. ; Ruggiero, G. ; Secondo, R.
Author_Institution
Eur. Organ. for Nucl. Res. (CERN), Geneva, Switzerland
fYear
2013
fDate
8-12 July 2013
Firstpage
1
Lastpage
7
Abstract
In the context of the CERN ´Radiation To Electronics (R2E)´ project, the vulnerability of a variety of components for particle accelerators electronics to single event effects, total ionizing dose and displacement damage has been analysed. The tested parts include analog, linear, digital, and hybrid devices and a summary of radiation test results is provided in this paper.
Keywords
particle accelerators; radiation hardening (electronics); CERN radiation to electronics project; analog devices; candidate particle accelerator electronics; digital devices; displacement damage; hybrid devices; linear devices; radiation test; radiation-induced effects; single event effects; total ionizing dose; Large Hadron Collider; MOSFET; Neutrons; Operational amplifiers; Protons; Regulators; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location
San Francisco, CA
ISSN
2154-0519
Print_ISBN
978-1-4799-1136-3
Type
conf
DOI
10.1109/REDW.2013.6658187
Filename
6658187
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