Title :
Compendium of Total Ionizing Dose, Displacement Damage and Single Event Transient Test Data of Various Optocouplers for ESA
Author :
Poizat, Marc ; Sauvagnac, Maryse ; Samaras, A. ; Padie, Yannick ; Garcia, Paulo ; Renaud, B. ; Gouyet, L. ; Abadi, Jean Paul ; Widmeer, Fabien ; Le Goulven, Enoal ; Vaille, Maxime ; Vandevelde, B. ; Caunes, Thomas ; Puybusque, Ludovic ; Vignon, Gael ; Sal
Author_Institution :
Eur. Space Agency, Noordwijk, Netherlands
Abstract :
We present radiation test data on optocouplers from three different vendors including results on neutron (1MeV) and proton (30, 60, 190MeV) induced displacement damage, total ionizing dose (Co60) and proton induced Single Event Transients.
Keywords :
neutron effects; opto-isolators; proton effects; space vehicle electronics; transient analysis; ESA; electron volt energy 1 MeV; electron volt energy 190 MeV; electron volt energy 30 MeV; electron volt energy 60 MeV; neutron induced displacement damage; optocouplers; proton induced displacement damage; proton induced single event transients; radiation test data; single event transient test data; total ionizing dose; Degradation; Neutrons; Performance evaluation; Phototransistors; Protons; Silicon; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658192
