Title :
Compilation of Electronic Components SEE Test Results
Author :
Anashin, Vasily S. ; Kuznetsov, Alexander S. ; Kozyukov, Alexander E. ; Bakirov, Linaris R. ; Kazyakin, Anatoly A. ; Artemyev, Kirill A.
Author_Institution :
Joint - Stock Co. Inst. of Space Device Eng. (JSC ISDE), Moscow, Russia
Abstract :
The paper presents results of COTS and industrial electronic components SEE tests. Tests were provided to estimate electronic components for space missions. The article consists of experimental data compilation obtained at the Roscosmos (JSC ISDE) Test Facility IS OI-A (400M) based on cyclotron U- 400M of FNRL JINR.
Keywords :
cyclotrons; radiation hardening (electronics); space vehicle electronics; test facilities; COTS; FNRL JINR; JSC ISDE; Roscosmos test facility IS OI-A; U-400M cyclotron; experimental data compilation; industrial electronic component SEE tests; single event effect; space missions; Companies; Electronic components; Joints; Microcontrollers; Radiation effects; Test facilities;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658193
