DocumentCode
2148966
Title
Compilation of Electronic Components SEE Test Results
Author
Anashin, Vasily S. ; Kuznetsov, Alexander S. ; Kozyukov, Alexander E. ; Bakirov, Linaris R. ; Kazyakin, Anatoly A. ; Artemyev, Kirill A.
Author_Institution
Joint - Stock Co. Inst. of Space Device Eng. (JSC ISDE), Moscow, Russia
fYear
2013
fDate
8-12 July 2013
Firstpage
1
Lastpage
3
Abstract
The paper presents results of COTS and industrial electronic components SEE tests. Tests were provided to estimate electronic components for space missions. The article consists of experimental data compilation obtained at the Roscosmos (JSC ISDE) Test Facility IS OI-A (400M) based on cyclotron U- 400M of FNRL JINR.
Keywords
cyclotrons; radiation hardening (electronics); space vehicle electronics; test facilities; COTS; FNRL JINR; JSC ISDE; Roscosmos test facility IS OI-A; U-400M cyclotron; experimental data compilation; industrial electronic component SEE tests; single event effect; space missions; Companies; Electronic components; Joints; Microcontrollers; Radiation effects; Test facilities;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location
San Francisco, CA
ISSN
2154-0519
Print_ISBN
978-1-4799-1136-3
Type
conf
DOI
10.1109/REDW.2013.6658193
Filename
6658193
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