Title :
Hardness Assurance for Total Dose and Dose Rate Testing of a State-of-the-Art Off-Shore 32 nm CMOS Processor
Author :
LaBel, Kenneth A. ; Gigliuto, Robert A. ; Szabo, Carl M. ; Carts, Martin A. ; Kay, M. ; Sinclair, Tony ; Gadlage, Matthew ; Duncan, A. ; Ingalls, Dave
Author_Institution :
NASA Goddard Space Flight Center, Greenbelt, MD, USA
Abstract :
Hardness assurance test results of an Advanced Micro Devices, Inc. (AMD) 32 nm processor for total dose and dose rate response are presented. Testing was performed using commercial motherboards and software stress applications versus more traditional automated test equipment (ATE).
Keywords :
CMOS integrated circuits; automatic test equipment; hardness testing; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; AMD; ATE; advanced microdevices; automated test equipment; commercial motherboards; dose rate response; dose rate testing; hardness assurance test; off-shore CMOS processor; size 32 nm; software stress applications; Central Processing Unit; Cranes; Performance evaluation; Radiation effects; Software; Stress; Testing;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658198
