Title :
Run-time probabilistic detection of miscalibrated thermal sensors in many-core systems
Author :
Zhao, Jia ; Lu, Shiting ; Burleson, Wayne ; Tessier, Russell
Author_Institution :
Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, USA 01003-9284
Abstract :
Many-core architectures use large numbers of small temperature sensors to detect thermal gradients and guide thermal management schemes. In this paper a technique to identify thermal sensors which are operating outside a required accuracy is described. Unlike previous on-chip temperature estimation approaches, our algorithms are optimized to run on-line while thermal management decisions are being made. The accuracy of a sensor is determined by comparing its readings to expected values from a probability distribution function determined from surrounding sensors. Experiments show that a sensor operating outside a desired accuracy can be identified with a detection rate of over 90% and an average false alarm rate of < 6%, with a confidence level of 90%. The run time of our method is shown to be around 3× lower than a recently-published temperature estimation method, enhancing its suitability for run-time implementation.
Keywords :
Probability distribution; System-on-chip; Temperature distribution; Temperature measurement; Temperature sensors;
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
Print_ISBN :
978-1-4673-5071-6
DOI :
10.7873/DATE.2013.285