Title :
Single Event Burnout Observed in Schottky Diodes
Author :
George, Jeffrey S. ; Koga, R. ; Moision, Robert M. ; Arroyo, Arturo
Author_Institution :
Aerosp. Corp., El Segundo, CA, USA
Abstract :
We present observations of single event burnout in 200V Schottky diodes used in hybrid DC-DC converters. Two diode types were tested and showed varying sensitivity to heavy ions and protons.
Keywords :
DC-DC power convertors; Schottky diodes; radiation effects; Schottky diodes; heavy ions; hybrid DC-DC converter; protons; single event burnout; voltage 200 V; Ions; Protons; Schottky barriers; Schottky diodes; Silicon; Threshold voltage;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658207
