Title :
An ultra compact and broadband 15-75GHz BPSK modulator using 0.13-μm CMOS process
Author :
Hong-Yeh Chang ; Pei-Si Wu ; Tian-Wei Huang ; Huei Wang ; Yung-Chih Tsai ; Chun-Hung Chen
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Abstract :
In this paper, an ultra compact and broadband 15-75 GHz BPSK modulator using standard bulk 0.13-μm CMOS process is described. This modulator was constructed utilizing a new reflection-type topology, with the transmission lines implemented on the thick SiO2 layer as the substrate to avoid the lossy silicon. The overall chip size, including baseband, LO, and RF probe pads, is only 0.5 × 0.35 mm2. Compared with the previously reported GaAs modulators, this work demonstrates a more than 80% chip area reduction, and features an amplitude imbalance of within 0.5 dB with a phase imbalance of within 3° between 15 and 75 GHz. Regarding the modulation quality, the measured error vector magnitude (EVM) of the BPSK modulator at 40 GHz is within 3.5 and 7% for a data rate of 1 and 10 Mb/s, respectively. The LO-to-RF isolation is better than 40 dB among all the operation frequency. From continuous-wave (CW) spectrum characterization, the modulation bandwidth of the modulator is wider than 1 GHz.
Keywords :
CMOS integrated circuits; MIMIC; MMIC; modulators; phase shift keying; silicon compounds; 0.13 micron; 1 Mbit/s; 10 Mbit/s; 15 to 75 GHz; BPSK modulator; CMOS process; LO-to-RF isolation; MMIC; amplitude imbalance; broadband modulator; chip area reduction; continuous-wave spectrum characterization; error vector magnitude; modulation quality; phase imbalance; reflection-type topology; transmission lines; ultra compact modulator; Baseband; Binary phase shift keying; CMOS process; Gallium arsenide; Probes; Propagation losses; Radio frequency; Silicon; Topology; Transmission lines;
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
Print_ISBN :
0-7803-8845-3
DOI :
10.1109/MWSYM.2005.1516515