• DocumentCode
    2149572
  • Title

    Extracting analytical nonlinear models from analog circuits by recursive vector fitting of Transfer Function Trajectories

  • Author

    De Jonghe, Dimitri ; Deschrijver, Dirk ; Dhaene, Tom ; Gielen, Georges

  • Author_Institution
    KU Leuven, ESAT-MICAS, B-3001 Heverlee, Belgium
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    1448
  • Lastpage
    1453
  • Abstract
    This paper presents a technique for automatically extracting analytical behavioral models from the netlist of a nonlinear analog circuit. Subsequent snapshots of the internal circuit Jacobian are sampled during time-domain analysis and are then processed into Transfer Function Trajectories (TFT). The TFT data project the nonlinear dynamics of the system onto a hyperplane in the mixed state-space/frequency domain. Next Recursive Vector Fitting (RVF) algorithm is used to extract an analytical Hammerstein model out of the TFT data in an automated fashion. The resulting RVF model equations are implemented as an accurate nonlinear behavioral model in the time domain. The model is guaranteed stable by construction and can trade off complexity for accuracy. The technique is validated on a high-speed analog buffer circuit containing 70 linear and nonlinear components, showing a 7X speedup.
  • Keywords
    Approximation methods; Fitting; Integrated circuit modeling; Mathematical model; Thin film transistors; Time-domain analysis; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.295
  • Filename
    6513741