DocumentCode
2149572
Title
Extracting analytical nonlinear models from analog circuits by recursive vector fitting of Transfer Function Trajectories
Author
De Jonghe, Dimitri ; Deschrijver, Dirk ; Dhaene, Tom ; Gielen, Georges
Author_Institution
KU Leuven, ESAT-MICAS, B-3001 Heverlee, Belgium
fYear
2013
fDate
18-22 March 2013
Firstpage
1448
Lastpage
1453
Abstract
This paper presents a technique for automatically extracting analytical behavioral models from the netlist of a nonlinear analog circuit. Subsequent snapshots of the internal circuit Jacobian are sampled during time-domain analysis and are then processed into Transfer Function Trajectories (TFT). The TFT data project the nonlinear dynamics of the system onto a hyperplane in the mixed state-space/frequency domain. Next Recursive Vector Fitting (RVF) algorithm is used to extract an analytical Hammerstein model out of the TFT data in an automated fashion. The resulting RVF model equations are implemented as an accurate nonlinear behavioral model in the time domain. The model is guaranteed stable by construction and can trade off complexity for accuracy. The technique is validated on a high-speed analog buffer circuit containing 70 linear and nonlinear components, showing a 7X speedup.
Keywords
Approximation methods; Fitting; Integrated circuit modeling; Mathematical model; Thin film transistors; Time-domain analysis; Vectors;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.295
Filename
6513741
Link To Document