• DocumentCode
    2149605
  • Title

    A new broadband calibration method for cryogenic temperatures

  • Author

    Reuss, Thomas ; Richard, Jacques

  • Author_Institution
    Centre de Recherches sur les Trÿs Basses Tempÿratures CRTBT, Centre National de la Recherche Scientifique Grenoble, email: reuss@labs.polycnrs-gre.fr
  • Volume
    3
  • fYear
    1999
  • fDate
    Oct. 1999
  • Firstpage
    24
  • Lastpage
    27
  • Abstract
    In this paper a new calibration technique working at cryogenic temperatures over the broad frequency range from 0.16 to 20 GHz for the measurement of the complex input impedance of a one-port device is presented. The impedance is extracted from complex reflection coefficient measurements of the a thin film performed by a vector network analyser. The method has been validated by measuring metallic samples with a known temperature behaviour. Its broadband nature makes it particularly powerful when exploring a region of the magnetic field-temperature-frequency parameter space of superconductors that was previously inaccessible with a comparable precision.
  • Keywords
    Calibration; Cryogenics; Frequency measurement; Impedance measurement; Magnetic analysis; Magnetic field measurement; Performance evaluation; Reflection; Superconducting thin films; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 1999. 29th European
  • Conference_Location
    Munich, Germany
  • Type

    conf

  • DOI
    10.1109/EUMA.1999.338518
  • Filename
    4139541