DocumentCode :
2149617
Title :
Automatic circuit sizing technique for the analog circuits with flexible TFTs considering process variation and bending effects
Author :
Chen, Yen-Lung ; Wu, Wan-Rong ; Lu, Guan-Ruei ; Liu, Chien-Nan Jimmy
Author_Institution :
Dept. of Electrical Engineering, National Central University, Jung-Li City, Taiwan, ROC
fYear :
2013
fDate :
18-22 March 2013
Firstpage :
1458
Lastpage :
1461
Abstract :
Flexible electronics are possible alternative for portable consumer applications with many advantages. However, the circuit design for flexible electronics is still challenging, especially for sensitive analog circuits. Significant parameter variations and bending effects of flexible TFTs further increase the difficulties for circuit designers. In this paper, an automatic circuit sizing technique is proposed for the analog circuits with flexible TFTs. The process variation and bending effects of flexible TFTs are considered simultaneously in the optimization flow. As shown in the experimental results, the proposed approach can further improve the design yield and significantly reduce the design overhead.
Keywords :
Analog circuits; Equations; Flexible electronics; Mathematical model; Optimization; Thin film transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
ISSN :
1530-1591
Print_ISBN :
978-1-4673-5071-6
Type :
conf
DOI :
10.7873/DATE.2013.297
Filename :
6513743
Link To Document :
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