• DocumentCode
    2149617
  • Title

    Automatic circuit sizing technique for the analog circuits with flexible TFTs considering process variation and bending effects

  • Author

    Chen, Yen-Lung ; Wu, Wan-Rong ; Lu, Guan-Ruei ; Liu, Chien-Nan Jimmy

  • Author_Institution
    Dept. of Electrical Engineering, National Central University, Jung-Li City, Taiwan, ROC
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    1458
  • Lastpage
    1461
  • Abstract
    Flexible electronics are possible alternative for portable consumer applications with many advantages. However, the circuit design for flexible electronics is still challenging, especially for sensitive analog circuits. Significant parameter variations and bending effects of flexible TFTs further increase the difficulties for circuit designers. In this paper, an automatic circuit sizing technique is proposed for the analog circuits with flexible TFTs. The process variation and bending effects of flexible TFTs are considered simultaneously in the optimization flow. As shown in the experimental results, the proposed approach can further improve the design yield and significantly reduce the design overhead.
  • Keywords
    Analog circuits; Equations; Flexible electronics; Mathematical model; Optimization; Thin film transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.297
  • Filename
    6513743