Title :
Total Dose and Single Event Effects Testing of the Intersil ISL70444SEH Hardened Operational Amplifier
Author :
van Vonno, N.W. ; Williams, Barry ; Hood, Robert ; Thomson, E.J. ; Bernard, S.K.
Author_Institution :
Intersil Corp., Palm Bay, FL, USA
Abstract :
We report the results of SEE and low and high dose rate total dose testing of the Intersil ISL70444SEH hardened operational amplifier together with a discussion of the part´s electrical specifications and wafer fabrication process.
Keywords :
integrated circuit testing; operational amplifiers; semiconductor technology; Intersil ISL70444SEH; electrical specifications; hardened operational amplifier; single event effects testing; total dose effects testing; wafer fabrication process; Annealing; Monitoring; Operational amplifiers; Power supplies; Radiation effects; Testing; Transient analysis;
Conference_Titel :
Radiation Effects Data Workshop (REDW), 2013 IEEE
Conference_Location :
San Francisco, CA
Print_ISBN :
978-1-4799-1136-3
DOI :
10.1109/REDW.2013.6658221
