• DocumentCode
    2149836
  • Title

    Understanding the conduction mechanism of the chalcogenide Ag2S silver-doped through ab initio simulation

  • Author

    Todorova, Tsanka Z. ; Blaise, P. ; Vianello, E. ; Fonseca, L.R.C.

  • Author_Institution
    CEA, LETI, Grenoble, France
  • fYear
    2013
  • fDate
    16-20 Sept. 2013
  • Firstpage
    342
  • Lastpage
    345
  • Abstract
    Using first-principles calculations we have investigated the electronic properties of Ag2S, which is commonly employed as the active matrix in nonvolatile conductive-bridge random access memories (CBRAM). To better understand the origin of the high conductivity of Ag-doped Ag2S we have created a new model for the high temperature form of this material, with electronic properties in good agreement with the available data. We have found that for a local silver concentration of 7.02 × 10-4 mol/cm2Ag2S switches from a semiconductor to a metal, while for a slightly higher concentration of 7.05 × 10-4mol/cm3Ag2S forms polytetrahedral clusters within the structure. Our findings offer a consistent explanation for the measured high conductivity of Ag2S.
  • Keywords
    ab initio calculations; conduction bands; doping profiles; electrical conductivity; electrical conductivity transitions; energy gap; high-temperature effects; metal clusters; semiconductor materials; silver; silver compounds; Ag2S:Ag; CBRAM; ab initio simulation; active matrix; chalcogenide silver-doped Ag2S; conduction mechanism; conductivity; electronic properties; first-principles calculations; high temperature form; local silver concentration; nonvolatile conductive-bridge random access memories; polytetrahedral clusters; semiconductor-metal switches; Doping; Electrodes; Photonic band gap; Resistance; Semiconductor process modeling; Silver; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European
  • Conference_Location
    Bucharest
  • Type

    conf

  • DOI
    10.1109/ESSDERC.2013.6818888
  • Filename
    6818888