DocumentCode
2149836
Title
Understanding the conduction mechanism of the chalcogenide Ag2 S silver-doped through ab initio simulation
Author
Todorova, Tsanka Z. ; Blaise, P. ; Vianello, E. ; Fonseca, L.R.C.
Author_Institution
CEA, LETI, Grenoble, France
fYear
2013
fDate
16-20 Sept. 2013
Firstpage
342
Lastpage
345
Abstract
Using first-principles calculations we have investigated the electronic properties of Ag2S, which is commonly employed as the active matrix in nonvolatile conductive-bridge random access memories (CBRAM). To better understand the origin of the high conductivity of Ag-doped Ag2S we have created a new model for the high temperature form of this material, with electronic properties in good agreement with the available data. We have found that for a local silver concentration of 7.02 × 10-4 mol/cm2Ag2S switches from a semiconductor to a metal, while for a slightly higher concentration of 7.05 × 10-4mol/cm3Ag2S forms polytetrahedral clusters within the structure. Our findings offer a consistent explanation for the measured high conductivity of Ag2S.
Keywords
ab initio calculations; conduction bands; doping profiles; electrical conductivity; electrical conductivity transitions; energy gap; high-temperature effects; metal clusters; semiconductor materials; silver; silver compounds; Ag2S:Ag; CBRAM; ab initio simulation; active matrix; chalcogenide silver-doped Ag2S; conduction mechanism; conductivity; electronic properties; first-principles calculations; high temperature form; local silver concentration; nonvolatile conductive-bridge random access memories; polytetrahedral clusters; semiconductor-metal switches; Doping; Electrodes; Photonic band gap; Resistance; Semiconductor process modeling; Silver; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research Conference (ESSDERC), 2013 Proceedings of the European
Conference_Location
Bucharest
Type
conf
DOI
10.1109/ESSDERC.2013.6818888
Filename
6818888
Link To Document