DocumentCode :
2150004
Title :
Class-E current-driven center-tapped low dv/dt rectifier
Author :
Bartoli, M. ; Reatti, A. ; Kazimierczuk, M.K.
Author_Institution :
Dept. of Electron. Eng., Florence Univ., Italy
Volume :
1
fYear :
1995
fDate :
8-12 Oct 1995
Firstpage :
874
Abstract :
An analysis for a Class E current-driven center-tapped low dv/dt rectifier taking into account the transformer leakage inductances is given along with experimental verifications. The rectifier diodes turn on and off at low dv/dt. This results in low switching noise and low switching losses. Diode parasitic capacitances do not adversely affect the circuit operation. The absolute value of di/dt is limited at diode turn-off, reducing the reverse recovery current. The circuit is operated at a low output voltage ripple and, therefore, at a low power loss in the equivalent series resistance (ESR) of the filter capacitor. Experimental tests were performed for a rectifier circuit operated at an output power of PO=60 W, a minimum frequency of f=500 kHz, and an output voltage of VO=3.3 V. The theoretical and the experimental results are in good agreement. Experimental measurements demonstrate that the rectifier is suitable for high-power density, high-frequency applications that requires low-output voltages and high-currents
Keywords :
AC-DC power convertors; circuit testing; equivalent circuits; power semiconductor diodes; power semiconductor switches; power transformers; rectifying circuits; switching circuits; 3.3 V; 500 kHz; 60 W; Class E current-driven center-tapped low dv/dt rectifier; applications; equivalent series resistance; filter capacitor; measurements; output voltage ripple; parasitic capacitances; power loss; rectifier diodes; reverse recovery current; switching losses; switching noise; transformer leakage inductance; Capacitors; Circuit noise; Circuit testing; Diodes; Filters; Low voltage; Paramagnetic resonance; Parasitic capacitance; Rectifiers; Switching loss;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industry Applications Conference, 1995. Thirtieth IAS Annual Meeting, IAS '95., Conference Record of the 1995 IEEE
Conference_Location :
Orlando, FL
ISSN :
0197-2618
Print_ISBN :
0-7803-3008-0
Type :
conf
DOI :
10.1109/IAS.1995.530390
Filename :
530390
Link To Document :
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