• DocumentCode
    2150029
  • Title

    Using MPLS fault recovery mechanism and bandwidth reservation in network-on-chip

  • Author

    Pooyan, Mohammad ; Rad, Mohammad Reza Nouri ; Kourdy, Reza

  • Author_Institution
    Dept. of Electr. Eng., Shahed Univ., Tehran, Iran
  • Volume
    5
  • fYear
    2010
  • fDate
    26-28 Feb. 2010
  • Firstpage
    509
  • Lastpage
    513
  • Abstract
    As CMOS technology scales down into the deep submicron (DSM) domain, devices and interconnects are subject to new types of malfunctions and failures that are harder to predict and avoid with the current system-on-chip (SoC) design methodologies. In this paper we compare four reconfigurable fault recovery mechanism and path restoration schemes, namely, Haskin, Makam, Simple Dynamic and Shortest Dynamic in real network, in the sense of on chip network design methodology. These schemes are simulated by using NS-2 that provides the advantage of reusability of entities, thus increases the NoC fault-tolerant and reliability with Quality-of-Service.
  • Keywords
    CMOS integrated circuits; fault tolerance; integrated circuit design; integrated circuit reliability; multiprotocol label switching; network routing; network-on-chip; quality of service; reconfigurable architectures; CMOS technology; Haskin path restoration; MPLS fault recovery mechanism; Makam path restoration; bandwidth reservation; network-on-chip; quality-of-service; reconfigurable fault recovery mechanism; shortest dynamic path restoration; simple dynamic path restoration; system-on-chip design; Bandwidth; Computer networks; Design engineering; Diffserv networks; IP networks; Multiprotocol label switching; Network-on-a-chip; Protocols; Quality of service; Telecommunication traffic; Fault recovery mechanism; MultiProtocol Label Switching(MPLS); Network-on-Chip(NoC); Path Restoration; Quality of Service(QoS);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Automation Engineering (ICCAE), 2010 The 2nd International Conference on
  • Conference_Location
    Singapore
  • Print_ISBN
    978-1-4244-5585-0
  • Electronic_ISBN
    978-1-4244-5586-7
  • Type

    conf

  • DOI
    10.1109/ICCAE.2010.5451263
  • Filename
    5451263