DocumentCode
2150498
Title
Communication and migration energy aware design space exploration for multicore systems with intermittent faults
Author
Das, Anup ; Kumar, Akash ; Veeravalli, Bharadwaj
Author_Institution
Department of Electrical and Computer Engineering, National University of Singapore, Singapore
fYear
2013
fDate
18-22 March 2013
Firstpage
1631
Lastpage
1636
Abstract
Shrinking transistor geometries, aggressive voltage scaling and higher operating frequencies have negatively impacted the dependability of embedded multicore systems. Most existing research works on fault-tolerance have focused on transient and permanent faults of cores. Intermittent faults are a separate class of defects resulting from on-chip temperature, pressure and voltage variations and lasting for a few cycles to several seconds or more. Operations of cores impacted by intermittent faults are suspended during these cycles but come back alive when conditions become favorable. This paper proposes a technique to model the availability of multiprocessor systems-on-chip (MPSoCs) with intermittent and reparable device defects. This model is based on Markov chain with stochastic fault distribution and can be applied even for permanent faults. Based on this model, a design space pruning technique is proposed to select a set of task mappings (with variable resource usage), which minimizes the task communication energy while satisfying the MPSoC availability constraint. Moreover, task migration overhead is also minimized, which is an important consideration for frequently occurring intermittent and temperature related faults, where prolonged system downtime during task re-mapping is not desired. Experiments conducted with real-life and synthetic application task graphs demonstrate that the proposed technique minimizes communication energy by 30% and reduces migration overhead by 50% as compared to the existing approaches.
Keywords
Availability; Fault tolerance; Maintenance engineering; Markov processes; Mathematical model; Optimization; Steady-state;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.331
Filename
6513777
Link To Document