• DocumentCode
    2150599
  • Title

    High-Q resonators using FBAR/SAW technology and their applications

  • Author

    Ueda, Makoto ; Nishihara, Tokihiro ; Tsutsumi, J. ; Taniguchi, Shinji ; Yokoyama, Tomoki ; Inoue, Shingo ; Miyashita, Tadakazu ; Satoh, Y.

  • Author_Institution
    Fujitsu Labs. Ltd., Akashi, Japan
  • fYear
    2005
  • fDate
    12-17 June 2005
  • Abstract
    This paper describes FBAR and SAW resonators which have high-Q factor using unique technology, and their applications. A new electrode material suitable for AlN-based FBARs have been developed in order to realize high-Q factor for low loss. The necessary conditions for FBAR electrode materials are low resistivity and high acoustic impedance. It is found the properties of ruthenium (Ru) to be suitable for use as electrode materials for AlN-based FBARs. The resonant characteristics of FBAR using Ru electrodes indicates Qr of 1200 and an effective electromechanical coupling coefficient k2 of 6.7% at 2 GHz. On the contrary, SAW resonator with narrow finger electrode, which can suppress transverse leakage of SAW , shows Qr of 670 and k2of 7.1%. Furthermore, we applied these resonators to ladder-type FBAR filter for 2-GHz WCDMA and SAW duplexer for US-PCS, respectively, and achieved low-loss and step cut-off filters as a result.
  • Keywords
    III-V semiconductors; Q-factor; acoustic impedance; aluminium compounds; bulk acoustic wave devices; electrodes; piezoelectric thin films; ruthenium; surface acoustic wave resonators; 2 GHz; AlN; FBAR resonators; Q factor; Ru; SAW duplexer; SAW resonators; US PCS; WCDMA; acoustic impedance; electrode material; resistivity; Acoustic materials; Conductivity; Electrodes; Film bulk acoustic resonators; Fingers; Impedance; Multiaccess communication; Resonance; Resonator filters; Surface acoustic waves;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2005 IEEE MTT-S International
  • ISSN
    01490-645X
  • Print_ISBN
    0-7803-8845-3
  • Type

    conf

  • DOI
    10.1109/MWSYM.2005.1516561
  • Filename
    1516561