DocumentCode
2150682
Title
Crosstalk avoidance codes for 3D VLSI
Author
Kumar, Rajeev ; Khatri, Sunil P.
Author_Institution
Department of ECE, Texas A&M University, College Station 77843, USA
fYear
2013
fDate
18-22 March 2013
Firstpage
1673
Lastpage
1678
Abstract
In 3D VLSI, through-silicon vias (TSVs) are relatively large, and closely spaced. This results in a situation in which noise on one or more TSVs may deteriorate the delay and signal integrity of neighboring TSVs. In this paper, we first quantify the parasitics in contemporary TSVs, and then come up with a classification of crosstalk sequences as 0C, 1C, … 8C sequences. Next, we present inductive approaches to quantify the exact overhead for 8C, 6C and 4C crosstalk avoidance codes (CACs) for a 3×n mesh arrangement of TSVs. These overheads for different CACs for a 3×n mesh arrangement of TSVs are used to calculate the lower bounds on the corresponding overheads for an n×n mesh arrangements of TSVs. We also discuss an efficient way to implement the coding and decoding (CODEC) circuitry for limiting the maximum crosstalk to 6C. Our experimental results show that for a TSV mesh arrangement driven by inverters implemented in a 22nm technology, the coding based approaches yields improvements which are in line with the theoretical predictions.
Keywords
Capacitance; Couplings; Crosstalk; Encoding; Switches; Three-dimensional displays; Through-silicon vias;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.338
Filename
6513784
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