DocumentCode
2151011
Title
Growth mechanism on patterned surfaces and applications using metalorganic growth technologies
Author
Heinecke, Harald ; Veuhoff, Eberhard
Author_Institution
Dept. of Semicond. Phys., Ulm Univ., Germany
fYear
1994
fDate
27-31 Mar 1994
Firstpage
636
Lastpage
639
Abstract
For the fabrication of advanced optoelectronic devices metalorganic growth technologies will play an important role in the next years: metalorganic molecular beam epitaxy (MOMBE) and metalorganic vapor phase epitaxy (MOVPE). Both technologies are basically comparable. The former technology, however, uses a much lower system pressure so that a carrier gas is not required for the growth process. In this case due to the molecular nature of the gas beams gas phase reactions can be excluded. In MOMBE the chemical reactions for crystal growth take place at the growth front leading to surface selective growth (SSG). The mass transfer of reactants to the surface is not affected by desorption from masked or different surface areas so that high perfection selective area epitaxy (SAE) can be achieved. In MOVPE, however, additionally to surface reactions, effects of gas phase reactions and gas phase interdiffusion have to be taken into account
Keywords
chemical beam epitaxial growth; semiconductor growth; vapour phase epitaxial growth; chemical reactions; crystal growth; fabrication; gas phase interdiffusion; gas phase reactions; mass transfer; metalorganic growth; metalorganic molecular beam epitaxy; metalorganic vapor phase epitaxy; optoelectronic devices; patterned surfaces; selective area epitaxy; surface reactions; surface selective growth; Epitaxial growth; Epitaxial layers; Gallium arsenide; Geometry; Indium phosphide; Kinetic theory; Molecular beam epitaxial growth; Quantum well devices; Substrates; Surface morphology;
fLanguage
English
Publisher
ieee
Conference_Titel
Indium Phosphide and Related Materials, 1994. Conference Proceedings., Sixth International Conference on
Conference_Location
Santa Barbara, CA
Print_ISBN
0-7803-1476-X
Type
conf
DOI
10.1109/ICIPRM.1994.328313
Filename
328313
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