• DocumentCode
    2151163
  • Title

    Measurement of the Linewidth Enhancement Factor of InGaAlAs and InGaAsP laser diodes using the Fourier Series Expansion of the Amplified Spontaneous Emission spectrum

  • Author

    Byrne, D. ; Guo, W.H. ; Phelan, R. ; Lu, Q.Y. ; Donegan, J.F. ; Corbett, B.

  • Author_Institution
    Semicond. Photonics Group, Dublin
  • fYear
    2007
  • fDate
    17-22 June 2007
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The optical gain and linewidth enhancement factor (alpha) of a semiconductor laser are important parameters for device performance and design, especially for widely tunable lasers. The Hakki-Paoli (H-P) method is the most common method for measuring alpha. However this method of determining alpha is dependent on the resolution bandwidth of the analyser used. Here we introduce the Fourier series expansion (FSE) method to calculate alpha by first finding the round trip gain. By performing a Fourier series expansion on each longitudinal mode in the cavity and finding the ratio of two successive Fourier coefficients.
  • Keywords
    Fourier series; III-V semiconductors; aluminium compounds; gallium arsenide; gallium compounds; indium compounds; laser beams; laser cavity resonators; laser modes; laser tuning; laser variables measurement; semiconductor lasers; superradiance; FSE method; Fourier coefficients; Fourier series expansion; Hakki-Paoli method; InGaAlAs; InGaAsP; amplified spontaneous emission spectrum; laser cavity; laser diodes; linewidth enhancement factor; longitudinal mode; optical gain; round trip gain; semiconductor laser; tunable lasers; Bandwidth; Diode lasers; Fourier series; Optical design; Optical devices; Performance gain; Semiconductor lasers; Spontaneous emission; Stimulated emission; Tunable circuits and devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2007 and the International Quantum Electronics Conference. CLEOE-IQEC 2007. European Conference on
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4244-0931-0
  • Electronic_ISBN
    978-1-4244-0931-0
  • Type

    conf

  • DOI
    10.1109/CLEOE-IQEC.2007.4386004
  • Filename
    4386004