DocumentCode :
2151180
Title :
Automatic inspection system for defects classification of stretch knitted fabrics
Author :
Su, Te-Li ; Chen, Hua-wei ; Hong, Gui-Bing ; Ma, Chih-ming
Author_Institution :
Dept. of Cosmetic Applic. & Manage., St. Mary´´s Med. Nursing & Manage. Coll., Yilian, Taiwan
fYear :
2010
fDate :
11-14 July 2010
Firstpage :
125
Lastpage :
129
Abstract :
Fabric defect detection and classification plays a very important role for the automatic detection in fabrics. This study refers to the four common seen defects of stretch knitted fabrics: laddering, end-out, hole, and oil spot. First of all, wavelet transfer is applied to obtain its wavelet energy to take them as defect features of this image, and then the back-propagation neural network (BPNN) was used to carry out the defects classification of the fabrics. In addition, by using the Taguchi method combined with BPNN had improved the deficiency of BPNN, which requires overly time consuming trial-and-error to find the learning parameters, and therefore could converge even faster, having an even smaller convergence error and better recognition rate. Experimental results have proven the final root-mean-square error convergence of the Taguchi-based BPNN was 0.000199, and the recognition rate can reach 96.5%.
Keywords :
Taguchi methods; automatic optical inspection; backpropagation; fabrics; image classification; mean square error methods; production engineering computing; wavelet transforms; woven composites; Taguchi method; automatic inspection system; back-propagation neural network; end-out defect; fabric defect classification; fabric defect detection; hole defect; image defect features; laddering defect; oil spot defect; recognition rate; root-mean-square error convergence; stretch knitted fabric; wavelet energy; wavelet transfer; Artificial neural networks; Fabrics; Pattern recognition; Plastics; Wavelet analysis; Wavelet transforms; Neural network; Stretch knitted fabric; Taguchi method; Wavelet Transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Wavelet Analysis and Pattern Recognition (ICWAPR), 2010 International Conference on
Conference_Location :
Qingdao
Print_ISBN :
978-1-4244-6530-9
Type :
conf
DOI :
10.1109/ICWAPR.2010.5576302
Filename :
5576302
Link To Document :
بازگشت