DocumentCode :
2151270
Title :
Helical waveguide millimeter wave TWT
Author :
Liss, C. ; Harper, R. ; Puri, M.P.
Author_Institution :
Raytheon Co., Waltham, MA, USA
fYear :
1988
fDate :
11-14 Dec. 1988
Firstpage :
374
Lastpage :
377
Abstract :
It has been demonstrated that the ridge-loaded waveguide circuit is a viable slow-wave circuit for use in TWTs (traveling wave tubes) requiring a forward-wave fundamental mode. Cold test measurements of several circuits at frequencies above 40 GHz demonstrated a range of phase velocities corresponding to beam voltages as low as 10 kV. Interaction impedances from less than one ohm to several hundred ohms were also measured. Test results for a TWT using one of the ridge-loaded circuits correlated well with predicted behavior at the lower phase velocity. An experimental, semitransparent, millimeter-wave TWT was built and tested. The TWT, operating with E/sub w/=24.7 kV, demonstrated output power of 163 W at 42 GHz. The peak electronic efficiency of over 6% (at 42.4 GHz) and the maximum large signal gain of 24 dB (at 43.8 GHz) in an unattenuated circuit length of 2.0 in were close to calculated values. Because of the circuit dispersion, the instantaneous bandwidth was 1.3%. The 20-kV circuit voltage and greater than 20- Omega interaction impedance of this circuit show promise.<>
Keywords :
electron tube testing; travelling-wave-tubes; waveguide components; 163 W; 24 dB; 24.7 kV; 42 GHz; 42.4 GHz; 43.8 GHz; 6 percent; beam voltages; circuit dispersion; cold test measurements; forward-wave fundamental mode; instantaneous bandwidth; interaction impedance; large signal gain; millimeter wave TWT; output power; peak electronic efficiency; phase velocities; ridge-loaded waveguide circuit; slow-wave circuit; Circuit testing; Frequency measurement; Gain; Impedance measurement; Low voltage; Millimeter wave circuits; Millimeter wave measurements; Phase measurement; Power generation; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
Conference_Location :
San Francisco, CA, USA
ISSN :
0163-1918
Type :
conf
DOI :
10.1109/IEDM.1988.32834
Filename :
32834
Link To Document :
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