Automatic mapping of sediment layers

Author

Maroni, Claire-Sophie ; Quinquis, André ; Garlan, Thierry

Author_Institution

ENSIETA, Brest, France

Volume

3

fYear

1996

fDate

23-26 Sep 1996

Firstpage

1527

Abstract

A pattern growing technique is proposed in the automatic picking of sediment layers an sub-bottom profile images. An heuristic approach is presented using direction, proximity and reflection strength criteria. The contribution of multiresolution is discussed. This image processing algorithm is tested on real data. Automatic mapping of sub-bottom layers should significantly speed up data analysis, and sedimentary data base building. Furthermore such a mapping provides a kind of data compression

Keywords

geophysical signal processing; oceanic crust; seafloor phenomena; sediments; seismology; automatic mapping; automatic picking; data analysis; direction criterium; explosion seismology; geophysical measurement technique; heuristic approach; image processing algorithm; marine sediment; oceanic crust; pattern growing; proximity; reflection strength criteria; seafloor; sediment layer; sedimentary layers; seismic reflection profiling; signal processing; sub-bottom profile; subbottom; Data acquisition; Data analysis; Data compression; Energy resolution; Frequency; Oceans; Pulse compression methods; Sediments; Signal processing; Signal resolution;

fLanguage

English

Publisher

ieee

Conference_Titel

OCEANS '96. MTS/IEEE. Prospects for the 21st Century. Conference Proceedings

Conference_Location

Fort Lauderdale, FL

Print_ISBN

0-7803-3519-8

Type

conf

DOI

10.1109/OCEANS.1996.569138

Filename

569138