DocumentCode :
2151315
Title :
A SPICE-compatible model of Graphene Nano-Ribbon Field-Effect Transistors enabling circuit-level delay and power analysis under process variation
Author :
Chen, Ying-Yu ; Rogachev, Artem ; Sangai, Amit ; Iannaccone, Giuseppe ; Fiori, Gianluca ; Chen, Deming
Author_Institution :
Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, USA
fYear :
2013
fDate :
18-22 March 2013
Firstpage :
1789
Lastpage :
1794
Abstract :
This paper presents the first parameterized, SPICE-compatible compact model of a Graphene Nano-Ribbon Field-Effect Transistor (GNRFET) with doped reservoirs that also supports process variation. The current and charge models closely match numerical TCAD simulations. In addition, process variation in transistor dimension, edge roughness, and doping level in the reservoir are accurately modeled. Our model provides a means to analyze delay and power of graphene-based circuits under process variation, and offers design and fabrication insights for graphene circuits in the future. We show that edge roughness severely degrades the advantages of GNRFET circuits; however, GNRFET is still a good candidate for low-power applications.
Keywords :
Approximation methods; Delays; Graphene; Integrated circuit modeling; Logic gates; Mathematical model; Numerical models;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location :
Grenoble, France
ISSN :
1530-1591
Print_ISBN :
978-1-4673-5071-6
Type :
conf
DOI :
10.7873/DATE.2013.359
Filename :
6513805
Link To Document :
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