• DocumentCode
    2151315
  • Title

    A SPICE-compatible model of Graphene Nano-Ribbon Field-Effect Transistors enabling circuit-level delay and power analysis under process variation

  • Author

    Chen, Ying-Yu ; Rogachev, Artem ; Sangai, Amit ; Iannaccone, Giuseppe ; Fiori, Gianluca ; Chen, Deming

  • Author_Institution
    Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, USA
  • fYear
    2013
  • fDate
    18-22 March 2013
  • Firstpage
    1789
  • Lastpage
    1794
  • Abstract
    This paper presents the first parameterized, SPICE-compatible compact model of a Graphene Nano-Ribbon Field-Effect Transistor (GNRFET) with doped reservoirs that also supports process variation. The current and charge models closely match numerical TCAD simulations. In addition, process variation in transistor dimension, edge roughness, and doping level in the reservoir are accurately modeled. Our model provides a means to analyze delay and power of graphene-based circuits under process variation, and offers design and fabrication insights for graphene circuits in the future. We show that edge roughness severely degrades the advantages of GNRFET circuits; however, GNRFET is still a good candidate for low-power applications.
  • Keywords
    Approximation methods; Delays; Graphene; Integrated circuit modeling; Logic gates; Mathematical model; Numerical models;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
  • Conference_Location
    Grenoble, France
  • ISSN
    1530-1591
  • Print_ISBN
    978-1-4673-5071-6
  • Type

    conf

  • DOI
    10.7873/DATE.2013.359
  • Filename
    6513805