DocumentCode
2151315
Title
A SPICE-compatible model of Graphene Nano-Ribbon Field-Effect Transistors enabling circuit-level delay and power analysis under process variation
Author
Chen, Ying-Yu ; Rogachev, Artem ; Sangai, Amit ; Iannaccone, Giuseppe ; Fiori, Gianluca ; Chen, Deming
Author_Institution
Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, USA
fYear
2013
fDate
18-22 March 2013
Firstpage
1789
Lastpage
1794
Abstract
This paper presents the first parameterized, SPICE-compatible compact model of a Graphene Nano-Ribbon Field-Effect Transistor (GNRFET) with doped reservoirs that also supports process variation. The current and charge models closely match numerical TCAD simulations. In addition, process variation in transistor dimension, edge roughness, and doping level in the reservoir are accurately modeled. Our model provides a means to analyze delay and power of graphene-based circuits under process variation, and offers design and fabrication insights for graphene circuits in the future. We show that edge roughness severely degrades the advantages of GNRFET circuits; however, GNRFET is still a good candidate for low-power applications.
Keywords
Approximation methods; Delays; Graphene; Integrated circuit modeling; Logic gates; Mathematical model; Numerical models;
fLanguage
English
Publisher
ieee
Conference_Titel
Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013
Conference_Location
Grenoble, France
ISSN
1530-1591
Print_ISBN
978-1-4673-5071-6
Type
conf
DOI
10.7873/DATE.2013.359
Filename
6513805
Link To Document