DocumentCode
2151425
Title
Application of decomposition theories to experimental scattering data from dielectric rough surfaces
Author
Cucurachi, Andrea ; Molinet, Frédéric ; Nesti, Giuseppe
Author_Institution
Société MOTHESIM La Boursidiére, RN 186, BP 182, Le Plessis Robinson, France
Volume
3
fYear
1999
fDate
Oct. 1999
Firstpage
323
Lastpage
326
Abstract
The results of the polarimetric analysis of the experimental data taken in the European Microwave Signature Laboratory at JRC, relative to two different rough surfaces, are presented. Firstly, it is shown how the staistics of the reflected field, represented on the polarisation chart, depend on roughness, frequency, dielectric constant and incidence angle : this consideration already permits a rough and qualitative discrimination among the analysed surfaces (´smooth surface´, ´rough surface´). An alternative criterion, founded on the application of the decomposition theorems by Cloude, Huynen and Krokager, is then suggesed and evaluated. In fact, it is shown that the parameters extracted from such theorems (the entropy and the parameter ¿ associated to the coherency matrix decomposition; the Euler angle ¿ of the single-target and the trace of the N-target relative to Mueller matrix decomposition ; the coefficients kd and kh coming from the decomposition of an averaged Sinclair matrix) also depend on the physical characteristics of the terrain ; this kind of analysis leads to an efficient and accurate discrimination among the two considered surfaces.
Keywords
Dielectric constant; Frequency; Matrix decomposition; Microwave theory and techniques; Optical scattering; Optical surface waves; Polarization; Rough surfaces; Surface roughness; Surface waves;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference, 1999. 29th European
Conference_Location
Munich, Germany
Type
conf
DOI
10.1109/EUMA.1999.338559
Filename
4139617
Link To Document