DocumentCode
2152001
Title
Silk Texture Defect Recognition System Using Computer Vision and Artificial Neural Networks
Author
Oonsivilai, Anant ; Meeboon, Nittaya
Author_Institution
Alternative & Sustainable Energy Res. Unit, Suranaree Univ. of Technol., Nakhon Ratchasima, Thailand
fYear
2009
fDate
17-19 Oct. 2009
Firstpage
1
Lastpage
4
Abstract
Competiveness of textile industries depends on the quality control of production. In order to minimize production cost, effort is directed towards less defectiveness and time spent on production operations. More accuracy in silk texture defect identification should be maintained so as eliminate any abnormality in the silk texture that hinders its acceptability by the consumer. In this paper, silk texture defect identification is achieved by implementing artificial neural network (ANN) technique. Methodology for feature selection that leads to high recognition rates and to simpler classification systems architectures is presented.
Keywords
computer vision; image recognition; image texture; neural nets; textile industry; artificial neural networks; computer vision; high recognition rates; production quality control; silk texture defect identification; silk texture defect recognition system; simpler classification systems; textile industries; Artificial neural networks; Biological neural networks; Biology computing; Computer networks; Computer vision; Humans; Inspection; Neurons; Production; Textile industry;
fLanguage
English
Publisher
ieee
Conference_Titel
Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
Conference_Location
Tianjin
Print_ISBN
978-1-4244-4129-7
Electronic_ISBN
978-1-4244-4131-0
Type
conf
DOI
10.1109/CISP.2009.5303972
Filename
5303972
Link To Document