• DocumentCode
    2152001
  • Title

    Silk Texture Defect Recognition System Using Computer Vision and Artificial Neural Networks

  • Author

    Oonsivilai, Anant ; Meeboon, Nittaya

  • Author_Institution
    Alternative & Sustainable Energy Res. Unit, Suranaree Univ. of Technol., Nakhon Ratchasima, Thailand
  • fYear
    2009
  • fDate
    17-19 Oct. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Competiveness of textile industries depends on the quality control of production. In order to minimize production cost, effort is directed towards less defectiveness and time spent on production operations. More accuracy in silk texture defect identification should be maintained so as eliminate any abnormality in the silk texture that hinders its acceptability by the consumer. In this paper, silk texture defect identification is achieved by implementing artificial neural network (ANN) technique. Methodology for feature selection that leads to high recognition rates and to simpler classification systems architectures is presented.
  • Keywords
    computer vision; image recognition; image texture; neural nets; textile industry; artificial neural networks; computer vision; high recognition rates; production quality control; silk texture defect identification; silk texture defect recognition system; simpler classification systems; textile industries; Artificial neural networks; Biological neural networks; Biology computing; Computer networks; Computer vision; Humans; Inspection; Neurons; Production; Textile industry;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image and Signal Processing, 2009. CISP '09. 2nd International Congress on
  • Conference_Location
    Tianjin
  • Print_ISBN
    978-1-4244-4129-7
  • Electronic_ISBN
    978-1-4244-4131-0
  • Type

    conf

  • DOI
    10.1109/CISP.2009.5303972
  • Filename
    5303972