DocumentCode :
2152318
Title :
Statistical design characterization of analog circuits
Author :
Luk, Timwah ; Potts, David C.
Author_Institution :
Fairchild Semicond., Portland, ME, USA
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
1705
Lastpage :
1708
Abstract :
Analog designs typically employ multiple core building block circuits, including current mirrors, band gap references, differential pairs and op amps, which require precisely matched performance between multiple devices. However, due to the statistical nature of the fabrication process, there will always be slight differences between these critical devices, contributing towards increased variation in circuit performance. Understanding the impact and potential interactions of variations between these matched devices may be critical in producing a commercially viable product. Following a brief overview of the nature of statistical process variation, we will demonstrate how to systematically evaluate components of a band gap circuit to isolate matching sensitivities and refine the sizings for optimized results.
Keywords :
analogue circuits; statistical analysis; analog circuits characterization; analog designs; band gap circuit; band gap references; fabrication process; op amps; statistical design; statistical process variation; Aging; Analog circuits; Circuit optimization; Fabrication; Mirrors; Operational amplifiers; Photonic band gap; Preventive maintenance; Semiconductor devices; Semiconductor materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4734908
Filename :
4734908
Link To Document :
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