• DocumentCode
    2152320
  • Title

    A new algorithm for infrared image restoration based on multi-scale morphological wavelet and Hopfield neural network

  • Author

    Tan, Jian-hui ; Pan, Bao-chang ; Liang, Jian ; Huang, Yong-hui ; Fan, Xiao-yan

  • Author_Institution
    Fac. of Inf. Eng., Guangdong Univ. of Technol., Guangzhou, China
  • fYear
    2010
  • fDate
    11-14 July 2010
  • Firstpage
    266
  • Lastpage
    270
  • Abstract
    Based on the complexity and randomness of the infrared image degradation factors, and integrates the strong de-noising features of multi-scale morphological wavelet and the salient problem solving features of Hopfield neural network in optimization, this paper presents a new algorithm for infrared degraded image restoration. The algorithm takes advantage of the continuous recycle between "multi-scale morphological wavelet de-noising" and "Hopfield neural network iteration" so as to makes access to a better recovery of infrared images. The algorithm also solves the problems in noise suppression and image detail protection of traditional Hopfield neural network image restoration algorithm and successfully protects the edge of the recovery images and details. Simulation results prove the effectiveness of the recovery algorithm.
  • Keywords
    Hopfield neural nets; image denoising; image restoration; infrared imaging; iterative methods; mathematical morphology; optimisation; wavelet transforms; Hopfield neural network iteration; infrared degraded image restoration; multiscale morphological wavelet denoising; noise suppression; optimization; salient problem solving feature; Algorithm design and analysis; Hopfield neural networks; Image restoration; Noise; Signal resolution; Wavelet analysis; Wavelet transforms; Algorithm; Hopfield neural network; Image restoration; Infrared image; Multi-scale morphological wavelet;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wavelet Analysis and Pattern Recognition (ICWAPR), 2010 International Conference on
  • Conference_Location
    Qingdao
  • Print_ISBN
    978-1-4244-6530-9
  • Type

    conf

  • DOI
    10.1109/ICWAPR.2010.5576349
  • Filename
    5576349