Title :
De-embedding of board parasitics with T-parameters for S-parameter measurements of integrated circuits on PCB -examinations in one-port measurements-
Author :
Maeda, Kumiko ; Iokibe, Kengo ; Toyota, Yoshitaka ; Koga, R.
Author_Institution :
Grad. Sch. of Natural Sci. & Technol., Okayama Univ., Okayama, Japan
Abstract :
In this paper, the authors evaluate T-matrix extraction method. The method is de-embedding DUT by T-matrix from actual measurement comprising both the parasitics and DUT. The proposed method were more accurate than that by the port-extension function. Result for different trace pattern gave similar results for RC series circuit up to 2 GHz. The calculated MSL parameter also gave consistent result for the RC series circuit up to 2 GHz. It was, however, found that an enough accurate calculation model is necessary to assure a reliable result.
Keywords :
S-parameters; integrated circuits; printed circuits; PCB; RC series circuit; S-parameter measurements; T-matrix extraction; T-parameters; board parasitics de-embedding; de-embedding DUT; integrated circuits; port extension function; Circuit testing; Distributed parameter circuits; Electrical resistance measurement; Electromagnetic compatibility; Impedance; Integrated circuit measurements; Microstrip; Power transmission lines; Scattering parameters; Semiconductor device measurement;
Conference_Titel :
Environmental Electromagnetics, 2009. CEEM 2009. 5th Asia-Pacific Conference on
Conference_Location :
Xian
Print_ISBN :
978-1-4244-4344-4
DOI :
10.1109/CEEM.2009.5303985