Title : 
A high-performance interface for platinum temperature sensors with long-cable
         
        
            Author : 
Li, Xiujun ; Meijer, Gerard C M
         
        
            Author_Institution : 
Fac. of Inf. Technol. & Syst., Delft Univ. of Technol., Delft, Netherlands
         
        
        
        
        
        
            Abstract : 
This paper presents a low-cost, high-performance sensor interface for resistive platinum temperature sensors with a long connection cable. The interface design is based on the use of a relaxation oscillator. The effects of interference and parasitic elements are reduced by applying some classical and new measurement techniques in the sensor interface design. The sensor is supplied with a DC excitation signal, which allows the use of a very long cable for the sensor connection. Meanwhile, the advanced chopping technique reduces the effect low-frequency interferences. The sensor interface has been manufactured with 0.7 ¿m CMOS technology. Experimental results show that the sensor interface is able to measure a resistance in the range of 0 ¿ to 200 ¿ with a resolution of 3.5 m¿ (0.009 °C @ t = 0 °C) and a systematic error of 6.8 m¿ (0.018 °C @ t = 0 °C). The measurement time amounts to 110 ms.
         
        
            Keywords : 
CMOS integrated circuits; cables (electric); platinum; relaxation oscillators; temperature sensors; CMOS technology; DC excitation signal; Pt; high-performance interface; long connection cable; low-frequency interferences; platinum temperature sensors; relaxation oscillator; resistance 0 ohm to 200 ohm; size 0.7 mum; CMOS technology; Electrical resistance measurement; Interference; Manufacturing; Measurement techniques; Oscillators; Platinum; Sensor systems; Temperature sensors; Time measurement;
         
        
        
        
            Conference_Titel : 
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
         
        
            Conference_Location : 
Beijing
         
        
            Print_ISBN : 
978-1-4244-2185-5
         
        
            Electronic_ISBN : 
978-1-4244-2186-2
         
        
        
            DOI : 
10.1109/ICSICT.2008.4734909