Title :
High speed quantum dot lasers
Author :
Bhattacharya, P. ; Ghosh, S. ; Wu, Z.-K. ; Norris, T.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
Self-organized quantum dot lasers, grown by MBE or MOVPE, have demonstrated superior characteristics such as large differential gain, ultra-low threshold current, high output power and large output tunability. However. these devices have successfully eluded researchers in the realization of large modulation bandwidths at room temperature. Typically, a bandwidth f-3 dB ∼5 to 7 GHz is measured in single-mode quantum dot lasers. In this paper, we will introduce and describe the technique of tunnel injection of carriers in quantum dot lasers and the benefits therefrom. Wc have recently demonstrated very high modulation bandwidth (>20 GHz), high T0 (363 K in 5° < T < 60°C and 202 K in 60° < T < 100°C), and low Auger recombination coefficients (∼ 3.3 × 10-29 cm6/s to 3.8 × 10-29 cm6/s in the temperature range 15°C < T < 85°C) in In0.4Ga0.6As/GaAs self-organized quantum dot tunnel injection lasers.
Keywords :
III-V semiconductors; MOCVD; electron-hole recombination; gallium arsenide; gallium compounds; high-speed optical techniques; indium compounds; laser tuning; molecular beam epitaxial growth; optical modulation; quantum dot lasers; semiconductor device testing; semiconductor growth; semiconductor quantum dots; tunnelling; 202 K; 363 K; 5 to 100 degC; Auger recombination coefficients; In0.4Ga0.6As-GaAs; MBE; MOVPE; differential gain; high output power; high speed lasers; modulation bandwidth; room temperature; self-organized quantum dot lasers; single-mode quantum dot lasers; tunability; tunnel carrier injection; tunnel injection lasers; ultralow threshold current; Bandwidth; Epitaxial growth; Epitaxial layers; Gallium arsenide; Power generation; Power lasers; Quantum dot lasers; Radiative recombination; Temperature distribution; Threshold current;
Conference_Titel :
Optoelectronic and Microelectronic Materials and Devices, 2002 Conference on
Print_ISBN :
0-7803-7571-8
DOI :
10.1109/COMMAD.2002.1237179