DocumentCode :
2152767
Title :
High temperature operation of AlGaN/GaN HEMT
Author :
Adachi, Nobuo ; Tateno, Yasunori ; Mizuno, Shinya ; Kawano, Akihiro ; Nikaido, Junichiro ; Sano, Seigo
Author_Institution :
Eudyna Devices Inc., Yamanashi, Japan
fYear :
2005
fDate :
12-17 June 2005
Abstract :
We investigated high temperature operation of AlGaN/GaN HEMTs. At channel temperature of 269 degC, a linear gain of 12.3 dB and a power added efficiency of 53.6% were achieved at 2.14 GHz, less than 50 V operations. These are sufficient performance to practical application. At channel temperature of 368 degC, the linear gain was 10.4 dB and a power added efficiency of 43.9% was achieved. We also investigated the temperature dependence of equivalent circuit values, and found that the temperature dependence of saturated output power and the linear gain is originated from the temperature dependence of electron velocity in the channel.
Keywords :
III-V semiconductors; UHF field effect transistors; aluminium compounds; gallium compounds; high electron mobility transistors; high-temperature electronics; wide band gap semiconductors; 10.4 dB; 12.3 dB; 2.14 GHz; 269 C; 368 C; 43.9 percent; 53.6 percent; AlGaN-GaN; HEMT devices; equivalent circuit parameters; high temperature operation; linear gain; power amplifiers; saturated output power; temperature-dependent electron velocity; Aluminum gallium nitride; Electrical resistance measurement; Gain; Gallium arsenide; Gallium nitride; HEMTs; Silicon; Surface resistance; Temperature dependence; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2005 IEEE MTT-S International
ISSN :
01490-645X
Print_ISBN :
0-7803-8845-3
Type :
conf
DOI :
10.1109/MWSYM.2005.1516642
Filename :
1516642
Link To Document :
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