Title :
Detecting IMD Sweet Spots in LDMOS Devices through an Accurate Nonlinear Characterization
Author :
González, P.J. ; Herran, Luis ; García, J.A. ; Fernandez, T. ; Tazón, A. ; Mediavilla, A. ; García, J.L.
Author_Institution :
ACORDE, Santander, Spain. pedroj@dicom.unican.es
Abstract :
The existence of small signal intermodulation distortion (IMD) "sweet spots" in RF Power LDMOS FETs is accurately predicted through a not previously reported complete characterization of the Ids(Vgs,Vds) Taylor-series coefficients. These results have been employed in optimizing the nonlinear distortion behavior of a 1.8 GHz power amplifier.
Keywords :
FETs; Intermodulation distortion; Linearity; MOSFETs; Nonlinear distortion; Power amplifiers; RF signals; Radio frequency; Radiofrequency amplifiers; Transconductance;
Conference_Titel :
Microwave Conference, 2000. 30th European
Conference_Location :
Paris, France
DOI :
10.1109/EUMA.2000.338655
