DocumentCode
2153029
Title
High gain lateral bipolar transistor
Author
Verdonckt-Vandebroek, S. ; Wong, S.S. ; Ko, P.K.
Author_Institution
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
fYear
1988
fDate
11-14 Dec. 1988
Firstpage
406
Lastpage
409
Abstract
The authors describe a submicron BiMOS process in which the lateral BJTs (bipolar junction transistors) are so similar to the MOSFETs that no extra process steps are needed. A lateral npn BJT with beta higher than 1000 has been demonstrated. A lateral pnp BJT with high cutoff frequency has been demonstrated, provided the parasitic capacitances are minimized. It is believed that this lateral BJT can be utilized in many applications because it is inherently available in any submicron CMOS process that has been properly designed. Similarly, in a submicron n-well BiCMOS process with vertical npn BJT, a lateral pnp BJT (with high beta ) can be made available without any additional processing if the p-MOSFET is properly designed.<>
Keywords
BIMOS integrated circuits; bipolar transistors; integrated circuit technology; bipolar junction transistors; high cutoff frequency; high gain; lateral bipolar transistor; lateral npn BJT; parasitic capacitances; submicron BiMOS process; submicron CMOS process; submicron n-well BiCMOS process; Bipolar transistors; CMOS technology; Circuit noise; Design optimization; Fabrication; Implants; MOSFET circuits; Power dissipation; Silicon; Threshold voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 1988. IEDM '88. Technical Digest., International
Conference_Location
San Francisco, CA, USA
ISSN
0163-1918
Type
conf
DOI
10.1109/IEDM.1988.32842
Filename
32842
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