DocumentCode :
2153224
Title :
Recent advances in digital-domain background calibration techniques for multistep analog-to-digital converters
Author :
Chiu, Yun
Author_Institution :
Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2008
fDate :
20-23 Oct. 2008
Firstpage :
1905
Lastpage :
1908
Abstract :
An overview of the recent advances in digital-domain linearity enhancement techniques for multistep analog-to-digital converters (ADCs) is presented. Leveraging on increasingly more abundant on-chip processing, a built-in digital adaptability arises as the common denominator underlying most of these approaches. A multitude of the techniques are analyzed in this paper with the associated complexity, limitations, and potentials pointed out. The brief review serves as a stepping-stone for (and entails) more advanced studies in this booming field.
Keywords :
analogue-digital conversion; circuit complexity; digital-domain background calibration techniques; digital-domain linearity enhancement techniques; multistep analog-to-digital converters; on-chip processing; Analog-digital conversion; Calibration; Capacitors; Inverters; Linearity; Operational amplifiers; Power amplifiers; Redundancy; Switches; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State and Integrated-Circuit Technology, 2008. ICSICT 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2185-5
Electronic_ISBN :
978-1-4244-2186-2
Type :
conf
DOI :
10.1109/ICSICT.2008.4734939
Filename :
4734939
Link To Document :
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